| WARF: P98099US |  |
| Signal Enhancement for Fluorescence Microscopy |
| INVENTORS | • | John White, David Wokosin |
The Wisconsin Alumni Research Foundation (WARF) is seeking commercial partners interested in developing a technique that improves photon collection efficiency and image intensity for scanning fluorescence microscopy.
OVERVIEW
Scanning optical microscopes, such as confocal microscopes, are of increasing importance for looking at living cells and other biological structures. By using fluorescent molecules like GFP (green fluorescent protein), it is possible to locate, track and differentiate cells and cellular structures with scanning fluorescence microscopy. The quality of the images obtained is dependent on the collection of as much of the fluorescent signal emitted from the specimen as possible. In current models, the amount of light collected from the specimen by the objective lens may be relatively low.
THE INVENTION
UW-Madison researchers have developed a method for significantly improving photon collection efficiency and image intensity by placing a second dichroic mirror on the opposite side of the specimen as the objective lens. Specifically, an excitation beam is focused by an objective lens onto a specimen. The fluorescence emitted from the specimen is collected by the objective lens. This light is also collected by a condenser lens on the opposite side of the specimen and is directed to a dichroic mirror, which reflects the light photons through the specimen and then to the objective lens. This adds to the photons directly emitted from the specimen, thereby enhancing signal intensity.
APPLICATIONS
- Scanning fluorescence microscopy
KEY BENEFITS
- Increases photon collection efficiency
- Improves image intensity of the fluorescent signal by 45 to 70 percent
- No need to increase the intensity of the incident light beam on the specimen
- Reduces photolysis and photobleaching (normally caused by a high intensity incident light beam)
- Does not require a major modification of the existing laser scanning fluorescent microscope designs
ADDITIONAL INFORMATION
For More Information About the Inventors
Intellectual Property Status
Tech Fields
Analytical Instrumentation - Microscopy
Analytical Instrumentation - Optics
CONTACT INFORMATION
For current licensing status, please contact our team at
licensing@warf.org
or phone 608.262.4924. (Clicking this link will open a contact form in a popup window. If you have problems viewing the form, try disabling your popup blocker software.)
Since its founding in 1925 as the patenting and licensing organization for the University of Wisconsin-Madison, WARF has been working with business and industry to transform university research into products that benefit society. WARF intellectual property managers and licensing staff members are leaders in the field of university-based technology transfer. They are familiar with the intricacies of patenting, have worked with researchers in relevant disciplines, understand industries and markets, and have negotiated innovative licensing strategies to meet the individual needs of business clients.
