Wisconsin Alumni Research Foundation

Technology

Efficient Statistical Timing Analysis of Circuits

For integrated circuits, including very large scale integration (VLSI) circuits, to work properly, the signals traveling along the gates and interconnects must be properly timed. Using classical case ...
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Lizheng Zhang, Chung-Ping Chen, Yu Hen Hu | P04377US

Technology

Progressive Random Access Scan Circuitry

Very large scale integrated (VLSI) circuits are tested before use to evaluate reliability and performance. The two most common testing methods are serial-scan and random access scan (RAS). The se...
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Kewal Saluja, Dong Hyun Baik | P06048US

WARF