Wisconsin Alumni Research Foundation

Analytical Instrumentation, Methods & Materials
Analytical Instrumentation Methods Materials
KITS AND METHODS FOR SUPER-RESOLUTION MICROSCOPY
WARF: P200189US02

Inventors: Aussie Suzuki, Mark Burkard, Roshan Norman, Emma Recchia


The Invention
UW Madison Researchers have improved upon conventional expanded microscopy. They have developed novel 4-fold and a 12-fold mExM (modified expansion microscopy) methodologies, which stably and reproducibly expand a specimen. The new mExM methods can achieve ~5 nm accuracy with super-resolution microscopes and ~20 nm accuracy with regular wide-field microscopes. The technology is designed as a kit for mExM. The kit includes a chemically and biochemically inert mold and instructions for use of the mold in an mExM method.
Additional Information
For More Information About the Inventors
For current licensing status, please contact Jennifer Gottwald at [javascript protected email address] or 608-960-9854

WARF